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dc.citation.number 19 -
dc.citation.startPage 3083 -
dc.citation.title ELECTRONICS -
dc.citation.volume 11 -
dc.contributor.author Yeo, Jun Dong -
dc.contributor.author Woo, DooHyung -
dc.date.accessioned 2023-12-21T13:40:10Z -
dc.date.available 2023-12-21T13:40:10Z -
dc.date.created 2022-11-04 -
dc.date.issued 2022-09 -
dc.description.abstract This paper describes a new readout integrated circuit and non-uniformity correction (NUC) method that ensures that the bolometer array has low non-uniformity over a wide operating temperature range without a thermoelectric cooler (TEC). The proposed NUC minimizes the circuit and memory required for signal processing, making it suitable for compact and power-efficient portable infrared cameras. It corrects the aging phenomenon through start-up calibration and corrects non-uniformities without a TEC through calibration during operation mode. It minimizes the calibration process during operation mode and uses a pixel-level analog-to-digital converter to enable real-time NUC. A 0.18 mu m standard CMOS process is applied to the proposed NUC. The frame rate for calibration during the operation mode is approximately 14.3 Hz. The proposed NUC demonstrates excellent uniformity with a non-uniformity of less than 0.12% over a wide operating temperature range (-20 to 50 degrees C). -
dc.identifier.bibliographicCitation ELECTRONICS, v.11, no.19, pp.3083 -
dc.identifier.doi 10.3390/electronics11193083 -
dc.identifier.issn 2079-9292 -
dc.identifier.scopusid 2-s2.0-85139838692 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/60717 -
dc.identifier.wosid 000866664000001 -
dc.language 영어 -
dc.publisher MDPI -
dc.title Real-Time Non-Uniformity Correction without TEC for Microbolometer Array -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.relation.journalWebOfScienceCategory Computer Science, Information Systems; Engineering, Electrical & Electronic; Physics, Applied -
dc.relation.journalResearchArea Computer Science; Engineering; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor infrared -
dc.subject.keywordAuthor microbolometer -
dc.subject.keywordAuthor readout integrated circuit -
dc.subject.keywordAuthor non-uniformity correction -
dc.subject.keywordAuthor thermo-electric cooler -
dc.subject.keywordAuthor pixel-level ADC -

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