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Kwon, Jimin
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dc.citation.endPage 3123 -
dc.citation.number 7 -
dc.citation.startPage 3118 -
dc.citation.title IEEE TRANSACTIONS ON ELECTRON DEVICES -
dc.citation.volume 66 -
dc.contributor.author Kwon, Jimin -
dc.contributor.author Jung, Sungyeop -
dc.contributor.author Kim, Yun-Hi -
dc.contributor.author Jung, Sungjune -
dc.date.accessioned 2023-12-21T18:55:32Z -
dc.date.available 2023-12-21T18:55:32Z -
dc.date.created 2022-08-29 -
dc.date.issued 2019-07 -
dc.description.abstract This transaction proposes a symmetric bistaggered dual-gate organic thin-film transistor (TFT) to minimize the difference between the top and bottom channel current characteristics and demonstrates it through experiment and 2-D simulation. In dual-gate organic TFTs, asymmetric top and bottom channel currents are mainly a result of their asymmetric contact geometry. To address this geometric limitation, the contact electrodes were sandwiched between the two organic semiconductor layers to be placed in a staggered position to both top and bottom gates. Two-way current crowding at the bistaggered contact electrodes leads to high-charge injection efficiency in both channels. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.7, pp.3118 - 3123 -
dc.identifier.doi 10.1109/TED.2019.2917013 -
dc.identifier.issn 0018-9383 -
dc.identifier.scopusid 2-s2.0-85067615190 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/59190 -
dc.identifier.wosid 000472184900040 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Bistaggered Contact Geometry for Symmetric Dual-Gate Organic TFTs -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Physics, Applied -
dc.relation.journalResearchArea Engineering; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor 2-D simulation -
dc.subject.keywordAuthor contact resistance -
dc.subject.keywordAuthor device geometry -
dc.subject.keywordAuthor independent gate control -
dc.subject.keywordAuthor thin-film transistors (TFTs) -
dc.subject.keywordPlus THIN-FILM TRANSISTORS -
dc.subject.keywordPlus INTEGRATED-CIRCUITS -

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