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서영덕

Suh, Yung Doug
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DC Field Value Language
dc.citation.endPage + -
dc.citation.number 15 -
dc.citation.startPage 1139 -
dc.citation.title ADVANCED MATERIALS -
dc.citation.volume 12 -
dc.contributor.author Suh, Yung Doug -
dc.contributor.author Zenobi, Renato -
dc.date.accessioned 2023-12-22T12:06:59Z -
dc.date.available 2023-12-22T12:06:59Z -
dc.date.created 2022-01-24 -
dc.date.issued 2000-08 -
dc.description.abstract Vastly improved fiber probes for SNOM microscopy are the result of a new chemical etching method. The optical fiber's protective polymer coating is left on during the etching process, which gives rise to greatly improved tip surfaces (see Figure, right). The tips have a much higher damage threshold, allowing brighter transmission and opening the door to Raman imaging (e.g. of DNA) and laser ablation. -
dc.identifier.bibliographicCitation ADVANCED MATERIALS, v.12, no.15, pp.1139 - + -
dc.identifier.doi 10.1002/1521-4095(200008)12:15<1139::AID-ADMA1139>3.0.CO;2-8 -
dc.identifier.issn 0935-9648 -
dc.identifier.scopusid 2-s2.0-0034246529 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/58793 -
dc.identifier.url https://onlinelibrary.wiley.com/doi/10.1002/1521-4095(200008)12:15%3C1139::AID-ADMA1139%3E3.0.CO;2-8 -
dc.identifier.wosid 000088706800019 -
dc.language 영어 -
dc.publisher WILEY-V C H VERLAG GMBH -
dc.title Improved probes for scanning near-field optical microscopy -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Chemistry, Multidisciplinary; Chemistry, Physical; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied; Physics, Condensed Matter -
dc.relation.journalResearchArea Chemistry; Science & Technology - Other Topics; Materials Science; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.subject.keywordPlus FIBER TIPS -
dc.subject.keywordPlus RESOLUTION -
dc.subject.keywordPlus SPECTROSCOPY -

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