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Yoo, Jung-Woo
Nano Spin Transport Lab.
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dc.citation.endPage 63 -
dc.citation.startPage 59 -
dc.citation.title CURRENT APPLIED PHYSICS -
dc.citation.volume 34 -
dc.contributor.author Lee, Yuhan -
dc.contributor.author Lee, Myeongwon -
dc.contributor.author Jo, Junhyeon -
dc.contributor.author Lee, Seokmin -
dc.contributor.author Yoo, Jung-Woo -
dc.contributor.author Choi, Taeyoung -
dc.contributor.author Heinrich, Andreas -
dc.contributor.author Lee, Donghun -
dc.date.accessioned 2023-12-21T14:37:35Z -
dc.date.available 2023-12-21T14:37:35Z -
dc.date.created 2022-05-16 -
dc.date.issued 2022-02 -
dc.description.abstract We demonstrate imaging current flow in a transport device by measuring the current-induced Oersted field. A diamond scanning magnetometer that hosts a single nitrogen-vacancy (NV) center at the tip apex is used to obtain the image. We fabricate a U-shape of Pt wire and study evolution of the Oersted field as the current continuously changes its direction along the wire. We find a good agreement between the obtained results and the simulated images based on the Biot-Savart law. In order to show the capability of imaging different field components, we perform the same experiment but with two different axes of the NV center. This work provides a novel imaging method of the current profile and can be applied to various transport experiments. -
dc.identifier.bibliographicCitation CURRENT APPLIED PHYSICS, v.34, pp.59 - 63 -
dc.identifier.doi 10.1016/j.cap.2021.12.001 -
dc.identifier.issn 1567-1739 -
dc.identifier.scopusid 2-s2.0-85121230463 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/58574 -
dc.identifier.url https://linkinghub.elsevier.com/retrieve/pii/S1567173921002844 -
dc.identifier.wosid 000788426400001 -
dc.language 영어 -
dc.publisher ELSEVIER -
dc.title Imaging oersted field around current flowing wire based on a diamond scanning magnetometer -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Materials Science, Multidisciplinary; Physics, Applied -
dc.relation.journalResearchArea Materials Science; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Imaging current flow -
dc.subject.keywordAuthor Scanning magnetometer -
dc.subject.keywordAuthor Diamond NV center -
dc.subject.keywordPlus CURRENT-DENSITY -
dc.subject.keywordPlus SPIN -
dc.subject.keywordPlus ELECTRONS -

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