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- Jeong, Changwook
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Monterey, CA | - |
| dc.citation.title | IEEE Non-Volatile Semiconductor Memory Workshop | - |
| dc.contributor.author | Jeong, Changwook | - |
| dc.date.accessioned | 2023-12-20T05:39:03Z | - |
| dc.date.available | 2023-12-20T05:39:03Z | - |
| dc.date.created | 2022-04-07 | - |
| dc.date.issued | 2004-08-22 | - |
| dc.identifier.bibliographicCitation | IEEE Non-Volatile Semiconductor Memory Workshop | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/58543 | - |
| dc.publisher | IEEE | - |
| dc.title | Switching current scaling and reliability evaluation in PRAM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2004-08-22 | - |
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