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Jeong, Changwook
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dc.citation.endPage 5371 -
dc.citation.number 11 -
dc.citation.startPage 5364 -
dc.citation.title IEEE TRANSACTIONS ON ELECTRON DEVICES -
dc.citation.volume 68 -
dc.contributor.author Jeong, Changwook -
dc.contributor.author Myung, Sanghoon -
dc.contributor.author Huh, In -
dc.contributor.author Choi, Byungseon -
dc.contributor.author Kim, Jinwoo -
dc.contributor.author Jang, Hyunjae -
dc.contributor.author Lee, Hojoon -
dc.contributor.author Park, Daeyoung -
dc.contributor.author Lee, Kyuhun -
dc.contributor.author Jang, Wonik -
dc.contributor.author Ryu, Jisu -
dc.contributor.author Cha, Moon-Hyun -
dc.contributor.author Choe, Jae Myung -
dc.contributor.author Shim, Munbo -
dc.contributor.author Kim, Dae Sin -
dc.date.accessioned 2023-12-21T15:06:58Z -
dc.date.available 2023-12-21T15:06:58Z -
dc.date.created 2022-04-01 -
dc.date.issued 2021-11 -
dc.description.abstract There is a growing consensus that the physics-based model needs to be coupled with machine learning (ML) model relying on data or vice versa in order to fully exploit their combined strengths to address scientific or engineering problems that cannot be solved separately. We propose several methodologies of bridging technology computer-aided design (TCAD) simulation and artificial intelligence (AI) with its application to the tasks for which traditional TCAD faces challenges in terms of simulation runtime, coverage, and so on. AI-emulator that learns fine-grained information from rigorous TCAD enables simulation of process technologies and device in real-time as well as large-scale simulation such as full-pattern analysis of stress without high demand on computational resource. To accelerate atomistic molecular dynamics (MD) simulation, we have done a comparison study of descriptor-based and graph-based neural net potential, and also show their capability with large-scale and long-time simulation of silicon oxidation. Finally, we discuss the use of hybrid modeling of AI- and physics-based model for the case where physical equations are either fully or partially unknown. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5364 - 5371 -
dc.identifier.doi 10.1109/TED.2021.3093844 -
dc.identifier.issn 0018-9383 -
dc.identifier.scopusid 2-s2.0-85110884252 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/58461 -
dc.identifier.wosid 000711645500009 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Bridging TCAD and AI: Its Application to Semiconductor Design -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Physics, Applied -
dc.relation.journalResearchArea Engineering; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Semiconductor process modeling -
dc.subject.keywordAuthor Computational modeling -
dc.subject.keywordAuthor Predictive models -
dc.subject.keywordAuthor Mathematical model -
dc.subject.keywordAuthor Semiconductor device modeling -
dc.subject.keywordAuthor device simulation -
dc.subject.keywordAuthor full-chip level modeling -
dc.subject.keywordAuthor machine learning -
dc.subject.keywordAuthor process simulation -
dc.subject.keywordAuthor semiconductor -
dc.subject.keywordAuthor technology computer-aided design (TCAD) -
dc.subject.keywordAuthor Numerical models -
dc.subject.keywordAuthor Analytical models -
dc.subject.keywordAuthor Artificial intelligence (AI) -
dc.subject.keywordAuthor atomistic simulation -
dc.subject.keywordAuthor design optimization -
dc.subject.keywordPlus NEURAL-NETWORK -
dc.subject.keywordPlus DIAGNOSIS -

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