File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Full metadata record

DC Field Value Language
dc.citation.endPage 1218 -
dc.citation.number 4 -
dc.citation.startPage 1206 -
dc.citation.title IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY -
dc.citation.volume 64 -
dc.contributor.author Paek, Joon Ki -
dc.contributor.author Lee, Kyunghoon -
dc.contributor.author Kim, Jingook -
dc.date.accessioned 2023-12-21T13:48:56Z -
dc.date.available 2023-12-21T13:48:56Z -
dc.date.created 2022-04-15 -
dc.date.issued 2022-08 -
dc.description.abstract Four types of circuits for detecting system-level noises due to high-power electromagnetic (HPEM) pulses have been proposed and implemented in compact modules. The detection circuit provides digital information about the level or polarity of noises generated at specific power or signal nets. The sensed data are directly saved in the hardware, which is free from malfunctions of the applied system. For characterization and evaluation of the proposed circuits, transmission line pulse (TLP) and damped sinusoidal (DS) sources were constructed. The operation threshold curves of each detection circuit were theoretically derived and validated by measurements using the TLP source. The proposed detection circuits were then applied to the radiated HPEM experiments with the DS source. From the operation data of the detectors, the system-level noises generated by the radiated HPEM waves were quantitatively analyzed based on the operation threshold curve of each detector. The proposed detection circuits can play a role of a noninvasive diagnosis method for evaluating the effects of HPEM pulses inside a target application system. -
dc.identifier.bibliographicCitation IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, v.64, no.4, pp.1206 - 1218 -
dc.identifier.doi 10.1109/TEMC.2022.3156910 -
dc.identifier.issn 0018-9375 -
dc.identifier.scopusid 2-s2.0-85137001407 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/58305 -
dc.identifier.url https://ieeexplore.ieee.org/document/9741306 -
dc.identifier.wosid 000773234200001 -
dc.language 영어 -
dc.publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC -
dc.title Detection Circuits for System-Level Signal and Power Noises Due to High-Power Electromagnetic Pulses -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Telecommunications -
dc.relation.journalResearchArea Engineering; Telecommunications -
dc.type.docType Article; Early Access -
dc.description.journalRegisteredClass scie -
dc.subject.keywordAuthor Voltage measurement -
dc.subject.keywordAuthor Transmission line measurements -
dc.subject.keywordAuthor Sensitivity -
dc.subject.keywordAuthor Capacitors -
dc.subject.keywordAuthor Threshold voltage -
dc.subject.keywordAuthor Power transmission lines -
dc.subject.keywordAuthor Partial discharges -
dc.subject.keywordAuthor Damped sinusoid (DS) -
dc.subject.keywordAuthor electromagnetic pulse (EMP) -
dc.subject.keywordAuthor event viewer -
dc.subject.keywordAuthor high-power electromagnetic (HPEM) -
dc.subject.keywordAuthor intentional electromagnetic interference (IEMI) -
dc.subject.keywordAuthor malfunction -
dc.subject.keywordAuthor noninvasive diagnosis -
dc.subject.keywordAuthor soft-failure -
dc.subject.keywordAuthor transmission line pulse (TLP) -
dc.subject.keywordPlus SUSCEPTIBILITY -
dc.subject.keywordPlus WAVE -
dc.subject.keywordPlus PCB -

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.