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김대식

Kim, Dai-Sik
Nano Optics Group
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dc.citation.endPage 2515 -
dc.citation.number 17 -
dc.citation.startPage 2513 -
dc.citation.title APPLIED PHYSICS LETTERS -
dc.citation.volume 69 -
dc.contributor.author Kim, DS -
dc.contributor.author Ko, HS -
dc.contributor.author Kim, YM -
dc.contributor.author Rhee, SJ -
dc.contributor.author Hong, SC -
dc.contributor.author Yee, YH -
dc.contributor.author Yee, DS -
dc.contributor.author Woo, JC -
dc.contributor.author Choi, HJ -
dc.contributor.author Ihm, J -
dc.contributor.author Woo, DH -
dc.contributor.author Kang, KN -
dc.date.accessioned 2023-12-22T12:38:40Z -
dc.date.available 2023-12-22T12:38:40Z -
dc.date.created 2021-10-22 -
dc.date.issued 1996-10 -
dc.description.abstract A significant charge transfer, which differs from tunneling, over thick AlxGa1-xAs barrier in GaAs/AlxGa1-xAs asymmetric double quantum wells is studied by cw photoluminescence excitation (PLE) and time-resolved photoluminescence. It is found that 300-Angstrom-thick Al0.3Ga0.7As barrier is universally ''leaky'' with transport time of similar to 300 ps, while AlAs and AlAs/GaAs digital alloy barriers with same thickness are not. Aided by a model calculation, we suggest that the intrinsic inhomogeneities in the alloy, which recent x-ray and scanning tunneling microscope studies revealed, may be responsible. -
dc.identifier.bibliographicCitation APPLIED PHYSICS LETTERS, v.69, no.17, pp.2513 - 2515 -
dc.identifier.doi 10.1063/1.117724 -
dc.identifier.issn 0003-6951 -
dc.identifier.scopusid 2-s2.0-0040554513 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54687 -
dc.identifier.url https://aip.scitation.org/doi/10.1063/1.117724 -
dc.identifier.wosid A1996VN89800021 -
dc.language 영어 -
dc.publisher AMER INST PHYSICS -
dc.title Thick AlxGa1-xAs: An intrinsically percolating barrier owing to its microscopic structural inhomogeneity -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Physics, Applied -
dc.relation.journalResearchArea Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus SCANNING-TUNNELING-MICROSCOPY -

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