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RuoffRodney Scott

Ruoff, Rodney S.
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DC Field Value Language
dc.citation.endPage 787 -
dc.citation.number 4 -
dc.citation.startPage 784 -
dc.citation.title JOURNAL OF MATERIALS RESEARCH -
dc.citation.volume 7 -
dc.contributor.author KRAKOW, W -
dc.contributor.author RIVERA, NM -
dc.contributor.author ROY, RA -
dc.contributor.author RUOFF, RS -
dc.contributor.author CUOMO, JJ -
dc.date.accessioned 2023-12-22T13:07:26Z -
dc.date.available 2023-12-22T13:07:26Z -
dc.date.created 2021-10-20 -
dc.date.issued 1992-04 -
dc.description.abstract Single crystal films of C60 of different thickness values have been deposited on mica substrates by resistance evaporation. Electron diffraction and high resolution microscopy have been used to assess the orientational ordering and the nature of the defects present in these face-centered cubic films which exhibit a <111> direction normal to the film surface. -
dc.identifier.bibliographicCitation JOURNAL OF MATERIALS RESEARCH, v.7, no.4, pp.784 - 787 -
dc.identifier.doi 10.1557/JMR.1992.0784 -
dc.identifier.issn 0884-2914 -
dc.identifier.scopusid 2-s2.0-0026852859 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54571 -
dc.identifier.url https://link.springer.com/article/10.1557%2FJMR.1992.0784 -
dc.identifier.wosid A1992HP37000002 -
dc.language 영어 -
dc.publisher MATERIALS RESEARCH SOCIETY -
dc.title EPITAXIAL-GROWTH OF C-60 THIN-FILMS ON MICA -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Materials Science, Multidisciplinary -
dc.relation.journalResearchArea Materials Science -
dc.type.docType Note -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus C-60 -
dc.subject.keywordPlus CARBON -

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