THE GROWTH OF CRYSTALLINE VAPOR-DEPOSITED CARBON-60 THIN-FILMS

Abstract

Thin films (25-2500 angstrom) of C60 molecules have been deposited on both (001) NaCl and mica substrates at varying temperatures by resistive evaporation. Both electron diffraction and high resolution microscopy have been used to assess the degree of crystallinity, the orientational ordering and the nature of the defects present in these face-centered-cubic films. For NaCl, optimum conditions yielded polycrystalline films with a tendency towards a [110] orientation, while for mica, extended single crystal films have been fabricated which exhibit a [111] direction normal to the film surface.