File Download

There are no files associated with this item.

  • Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
Related Researcher

RuoffRodney Scott

Ruoff, Rodney S.
Read More

Views & Downloads

Detailed Information

Cited time in webofscience Cited time in scopus
Metadata Downloads

Full metadata record

DC Field Value Language
dc.citation.number 12 -
dc.citation.startPage 125101 -
dc.citation.title REVIEW OF SCIENTIFIC INSTRUMENTS -
dc.citation.volume 77 -
dc.contributor.author Lu, Shaoning -
dc.contributor.author Guo, Zaoyang -
dc.contributor.author Ding, Weiqiang -
dc.contributor.author Dikin, Dmitriy A. -
dc.contributor.author Lee, Junghoon -
dc.contributor.author Ruoff, Rodney S. -
dc.date.accessioned 2023-12-22T09:38:45Z -
dc.date.available 2023-12-22T09:38:45Z -
dc.date.created 2021-10-19 -
dc.date.issued 2006-12 -
dc.description.abstract A new microelectromechanical system (MEMS)-based tensile testing stage (with integrated actuator, direct load sensing beam, and electrodes for controlled assembly of an individual nanostructure) was developed and used for in situ tensile loading of a templated carbon nanotube (T-CNT) inside a scanning electron microscope (SEM). Specifically, an increasing tensile load was applied to the T-CNT by actuating the device and high-resolution scanning electron microscopy images were acquired at different loads. The load (from the bending of the direct force-sensing beam), the elongation of the specimen during loading, and the specimen geometry were all obtained from analysis of SEM images. The stress versus strain curve and Young's modulus were thus obtained. A model is presented for the tensile loading experiment, and the fit value of Young's modulus from this model is compared to values obtained by an independent method. The results of this experiment on a T-CNT suggest the use of this device for loading other nanostructures and also for designing other MEMS-based systems, such as a compressive testing stage. -
dc.identifier.bibliographicCitation REVIEW OF SCIENTIFIC INSTRUMENTS, v.77, no.12, pp.125101 -
dc.identifier.doi 10.1063/1.2400212 -
dc.identifier.issn 0034-6748 -
dc.identifier.scopusid 2-s2.0-33846069153 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54436 -
dc.identifier.url https://aip.scitation.org/doi/10.1063/1.2400212 -
dc.identifier.wosid 000243159100027 -
dc.language 영어 -
dc.publisher AMER INST PHYSICS -
dc.title In situ mechanical testing of templated carbon nanotubes -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation; Physics, Applied -
dc.relation.journalResearchArea Instruments & Instrumentation; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus BEAM-INDUCED DEPOSITION -
dc.subject.keywordPlus DIRECTED GROWTH -
dc.subject.keywordPlus ELECTRON -
dc.subject.keywordPlus DEVICES -
dc.subject.keywordPlus FILMS -
dc.subject.keywordPlus LOAD -
dc.subject.keywordPlus SEM -
dc.subject.keywordPlus TEM -

qrcode

Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.