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RuoffRodney Scott

Ruoff, Rodney S.
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dc.citation.endPage 11 -
dc.citation.number 1 -
dc.citation.startPage 1 -
dc.citation.title Proceedings of the Institution of Mechanical Engineers, Part N: Journal of Nanoengineering and Nanosystems -
dc.citation.volume 222 -
dc.contributor.author Zhao, Y. -
dc.contributor.author Inayat, S. -
dc.contributor.author Dikin, D.A. -
dc.contributor.author Singer, J.H. -
dc.contributor.author Ruoff, R.S. -
dc.contributor.author Troy, J.B. -
dc.date.accessioned 2023-12-22T09:06:34Z -
dc.date.available 2023-12-22T09:06:34Z -
dc.date.created 2021-10-20 -
dc.date.issued 2008 -
dc.description.abstract The patch clamp technique permits high-resolution recording of the ionic currents flowing through a cell's plasma membrane. In different configurations, this technique has allowed experimenters to record and manipulate the currents that flow either through single ion channels or those that flow across the whole plasma membrane. Unfortunately, the conventional patch clamp method is laborious, requiring the careful fabrication of electrodes, skillful manipulation of the patch pipette towards a cell, and the clever design of electronics and apparatus to allow low-noise recordings. Advances in microfabrication offer promising technologies for high-throughput patch clamp recordings, particularly suitable for drug screening. This paper provides a review of the advances that have been made in the patch clamp technique over the years and considers where application of nanotechnology might provide significant contributions in the future. -
dc.identifier.bibliographicCitation Proceedings of the Institution of Mechanical Engineers, Part N: Journal of Nanoengineering and Nanosystems, v.222, no.1, pp.1 - 11 -
dc.identifier.doi 10.1243/17403499JNN149 -
dc.identifier.issn 1740-3499 -
dc.identifier.scopusid 2-s2.0-77956207808 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54406 -
dc.identifier.url https://journals.sagepub.com/doi/10.1243/17403499JNN149 -
dc.language 영어 -
dc.publisher SAGE -
dc.title Patch clamp technique: Review of the current state of the art and potential contributions from nanoengineering -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.type.docType Review -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Automation -
dc.subject.keywordAuthor Electrophysiology -
dc.subject.keywordAuthor Microfabrication -
dc.subject.keywordAuthor Nanoactuation -
dc.subject.keywordAuthor Patch clamp technique -
dc.subject.keywordPlus Clever designs -
dc.subject.keywordPlus Drug screening -
dc.subject.keywordPlus High resolution -
dc.subject.keywordPlus High-throughput -
dc.subject.keywordPlus Ionic current -
dc.subject.keywordPlus Low noise -
dc.subject.keywordPlus Nano-engineering -
dc.subject.keywordPlus Nanoactuation -
dc.subject.keywordPlus Patch clamp method -
dc.subject.keywordPlus Patch clamp recording -
dc.subject.keywordPlus Patch clamp technique -
dc.subject.keywordPlus Patch pipette -
dc.subject.keywordPlus Plasma membranes -
dc.subject.keywordPlus Single-ion channels -
dc.subject.keywordPlus State of the art -
dc.subject.keywordPlus Cell membranes -
dc.subject.keywordPlus Electrophysiology -
dc.subject.keywordPlus Microanalysis -
dc.subject.keywordPlus Micromachining -
dc.subject.keywordPlus Neurology -
dc.subject.keywordPlus Microfabrication -

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