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dc.citation.endPage 7417 -
dc.citation.number 10 -
dc.citation.startPage 7407 -
dc.citation.title OPTICS EXPRESS -
dc.citation.volume 16 -
dc.contributor.author Adam, A. J. L. -
dc.contributor.author Brok, J. M. -
dc.contributor.author Seo, M. A. -
dc.contributor.author Ahn, K. J. -
dc.contributor.author Kim, D. S. -
dc.contributor.author Kang, J. H. -
dc.contributor.author Park, Q. H. -
dc.contributor.author Nagel, M. -
dc.contributor.author Planken, P. C. M. -
dc.date.accessioned 2023-12-22T08:40:05Z -
dc.date.available 2023-12-22T08:40:05Z -
dc.date.created 2021-10-21 -
dc.date.issued 2008-05 -
dc.description.abstract Using terahertz-light excitation, we have measured with sub-wavelength spatial, and sub-cycle temporal resolution the time- and frequency-dependent electric-field and surface-charge density in the vicinity of small metallic holes. In addition to a singularity like concentration of the electric field near the hole edges, we observe, that holes can act as differential operators whose near-field output is the time-derivative of the incident electric field. Our results confirm the well-known predictions made by Bouwkamp, Philips Res. Rep. 5, 321-332 (1950), and reveal, with unprecedented detail, what physically happens when light passes through a small hole. -
dc.identifier.bibliographicCitation OPTICS EXPRESS, v.16, no.10, pp.7407 - 7417 -
dc.identifier.doi 10.1364/OE.16.007407 -
dc.identifier.issn 1094-4087 -
dc.identifier.scopusid 2-s2.0-43849083227 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54396 -
dc.identifier.url https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-16-10-7407&id=159486 -
dc.identifier.wosid 000256469800066 -
dc.language 영어 -
dc.publisher OPTICAL SOC AMER -
dc.title Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Optics -
dc.relation.journalResearchArea Optics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus OPTICAL-TRANSMISSION -
dc.subject.keywordPlus HOLE -
dc.subject.keywordPlus DIFFRACTION -
dc.subject.keywordPlus MICROSCOPY -
dc.subject.keywordPlus PROBES -
dc.subject.keywordPlus LIGHT -

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