There are no files associated with this item.
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 2445 | - |
dc.citation.number | 12 | - |
dc.citation.startPage | 2442 | - |
dc.citation.title | OPTICS COMMUNICATIONS | - |
dc.citation.volume | 282 | - |
dc.contributor.author | Kihm, H. W. | - |
dc.contributor.author | Lee, K. G. | - |
dc.contributor.author | Kim, D. S. | - |
dc.contributor.author | Ahn, K. J. | - |
dc.date.accessioned | 2023-12-22T07:44:51Z | - |
dc.date.available | 2023-12-22T07:44:51Z | - |
dc.date.created | 2021-10-21 | - |
dc.date.issued | 2009-06 | - |
dc.description.abstract | In this paper, we theoretically and experimentally demonstrate that metal coated apertured probes are efficient near-field probes on surfaces with high reflectivity for the scattering as well as for the collection mode near-field scanning optical microscopy (NSOM). We show that a blunt apertured metal coated tip is very effective in suppressing image dipoles which affect strongly the signals scattered from frequently used sharp metal tips or gold nanoparticle attached probes. By using a simultaneous collection and scattering mode (dual mode) NSOM we measure the near-field images of surface plasmon polariton (SPP) launched from a slit. The collection mode measures propagating SPP along lateral distance in a long scan range with high signal-to-noise ratio, and the scattering mode measures the polarization resolved near-field of SPP. Comparisons of the measured data obtained in the dual mode enable to easily characterize SPP and to separate the measured near-field into the propagating SPP and the directly transmitted light. | - |
dc.identifier.bibliographicCitation | OPTICS COMMUNICATIONS, v.282, no.12, pp.2442 - 2445 | - |
dc.identifier.doi | 10.1016/j.optcom.2009.03.005 | - |
dc.identifier.issn | 0030-4018 | - |
dc.identifier.scopusid | 2-s2.0-65249160192 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/54364 | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0030401809002181?via%3Dihub | - |
dc.identifier.wosid | 000266131400028 | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | Dual mode near-field scanning optical microscopy for near-field imaging of surface plasmon polariton | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalResearchArea | Optics | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Apertureless near-field optical microscopy | - |
dc.subject.keywordAuthor | Surface plasmon | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Tel : 052-217-1404 / Email : scholarworks@unist.ac.kr
Copyright (c) 2023 by UNIST LIBRARY. All rights reserved.
ScholarWorks@UNIST was established as an OAK Project for the National Library of Korea.