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김대식

Kim, Dai-Sik
Nano Optics Group
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dc.citation.endPage 15731 -
dc.citation.number 15 -
dc.citation.startPage 15725 -
dc.citation.title OPTICS EXPRESS -
dc.citation.volume 18 -
dc.contributor.author Kihm, Hyun-woo -
dc.contributor.author Kim, Q. H. -
dc.contributor.author Kim, D. S. -
dc.contributor.author Ahn, K. J. -
dc.contributor.author Kang, J. H. -
dc.date.accessioned 2023-12-22T07:06:37Z -
dc.date.available 2023-12-22T07:06:37Z -
dc.date.created 2021-10-21 -
dc.date.issued 2010-07 -
dc.description.abstract We perform phase-sensitive imaging of optical wavefront emanating from a single nanoslit and propagating into free space by using scattering type near-field scanning optical microscope combined with an optical interferometer. By analyzing polarization resolved optical amplitudes and phases, the propagation directions of surface waves are determined and the phase difference between two orthogonal polarization components of the surface wave are discussed for increasing distance from the slit. -
dc.identifier.bibliographicCitation OPTICS EXPRESS, v.18, no.15, pp.15725 - 15731 -
dc.identifier.doi 10.1364/OE.18.015725 -
dc.identifier.issn 1094-4087 -
dc.identifier.scopusid 2-s2.0-77954914487 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/54323 -
dc.identifier.url https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-18-15-15725&id=203739 -
dc.identifier.wosid 000280693300051 -
dc.language 영어 -
dc.publisher OPTICAL SOC AMER -
dc.title Phase-sensitive imaging of diffracted light by single nanoslits: measurements from near to far field -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Optics -
dc.relation.journalResearchArea Optics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus SURFACE-PLASMON POLARITON -
dc.subject.keywordPlus OPTICAL MICROSCOPE -
dc.subject.keywordPlus TRANSMISSION -
dc.subject.keywordPlus SCATTERING -
dc.subject.keywordPlus ARRAYS -

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