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DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 186 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 177 | - |
dc.citation.title | SENSORS AND ACTUATORS A-PHYSICAL | - |
dc.citation.volume | 166 | - |
dc.contributor.author | Brown, J. J. | - |
dc.contributor.author | Baca, A. I. | - |
dc.contributor.author | Bertness, K. A. | - |
dc.contributor.author | Dikin, D. A. | - |
dc.contributor.author | Ruoff, R. S. | - |
dc.contributor.author | Bright, V. M. | - |
dc.date.accessioned | 2023-12-22T06:11:38Z | - |
dc.date.available | 2023-12-22T06:11:38Z | - |
dc.date.created | 2021-10-19 | - |
dc.date.issued | 2011-04 | - |
dc.description.abstract | This paper reports direct tensile tests on n-type (Si-doped) gallium nitride single crystal nanowires(1) that were grown by nitrogen plasma-assisted molecular beam epitaxy and which are essentially free of defects and residual strain. Nanowires were integrated with actuated, active microelectromechanical (MEMS) devices using dielectrophoresis-driven self-assembly and platinum-carbon clamps created using a gallium focused ion beam. For one nanowire, failure strain of 0.042 +/- 0.011 was found. Most nanowire specimens appeared to demonstrate tensile strength in the range of 4.0 +/- 1.7 GPa to 7.5 +/- 3.4 GPa. Failure modes included clamp failure, transverse (nanowire c-plane) fractures, and insufficient force from the MEMS test actuator. | - |
dc.identifier.bibliographicCitation | SENSORS AND ACTUATORS A-PHYSICAL, v.166, no.2, pp.177 - 186 | - |
dc.identifier.doi | 10.1016/j.sna.2010.04.002 | - |
dc.identifier.issn | 0924-4247 | - |
dc.identifier.scopusid | 2-s2.0-79952537796 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/54299 | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S0924424710001640?via%3Dihub | - |
dc.identifier.wosid | 000289815700002 | - |
dc.language | 영어 | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.title | Tensile measurement of single crystal gallium nitride nanowires on MEMS test stages | - |
dc.type | Article | - |
dc.description.isOpenAccess | FALSE | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic; Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Engineering; Instruments & Instrumentation | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordAuthor | Tensile Loading | - |
dc.subject.keywordAuthor | Gallium Nitride | - |
dc.subject.keywordAuthor | Nanowire | - |
dc.subject.keywordAuthor | Single Crystal | - |
dc.subject.keywordAuthor | Mechanical Testing | - |
dc.subject.keywordAuthor | MEMS | - |
dc.subject.keywordPlus | GAN | - |
dc.subject.keywordPlus | CONTACTS | - |
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