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Yoo, Jaejun
Lab. of Advanced Imaging Technology
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dc.citation.conferencePlace US -
dc.citation.conferencePlace Honolulu, HI, USA -
dc.citation.endPage 1121 -
dc.citation.startPage 1110 -
dc.citation.title IEEE Conference on Computer Vision and Pattern Recognition -
dc.contributor.author Timofte, R. -
dc.contributor.author Agustsson, E. -
dc.contributor.author Gool, L.V. -
dc.contributor.author Yang, M.-H. -
dc.contributor.author Zhang, L. -
dc.contributor.author Lim, B. -
dc.contributor.author Son, S. -
dc.contributor.author Kim, H. -
dc.contributor.author Nah, S. -
dc.contributor.author Lee, K.M. -
dc.contributor.author Wang, X. -
dc.contributor.author Tian, Y. -
dc.contributor.author Yu, K. -
dc.contributor.author Zhang, Y. -
dc.contributor.author Wu, S. -
dc.contributor.author Dong, C. -
dc.contributor.author Lin, L. -
dc.contributor.author Qiao, Y. -
dc.contributor.author Loy, C.C. -
dc.contributor.author Bae, W. -
dc.contributor.author Yoo, Jaejun -
dc.contributor.author Han, Y. -
dc.contributor.author Ye, J.C. -
dc.contributor.author Choi, J.-S. -
dc.contributor.author Kim, M. -
dc.contributor.author Fan, Y. -
dc.contributor.author Yu, J. -
dc.contributor.author Han, W. -
dc.contributor.author Liu, D. -
dc.contributor.author Yu, H. -
dc.contributor.author Wang, Z. -
dc.contributor.author Shi, H. -
dc.contributor.author Huang, T.S. -
dc.contributor.author Chen, Y. -
dc.contributor.author Zhang, K. -
dc.contributor.author Zuo, W. -
dc.contributor.author Tang, Z. -
dc.contributor.author Luo, L. -
dc.contributor.author Li, S. -
dc.contributor.author Fu, M. -
dc.contributor.author Cao, L. -
dc.contributor.author Heng, W. -
dc.contributor.author Bui, G. -
dc.contributor.author Le, T. -
dc.contributor.author Duan, Y. -
dc.contributor.author Tao, D. -
dc.contributor.author Wang, R. -
dc.contributor.author Lin, X. -
dc.contributor.author Pang, J. -
dc.contributor.author Xu, J. -
dc.contributor.author Zhao, Y. -
dc.contributor.author Xu, X. -
dc.contributor.author Pan, J. -
dc.contributor.author Sun, D. -
dc.contributor.author Song, X. -
dc.contributor.author Dai, Y. -
dc.contributor.author Qin, X. -
dc.contributor.author Huynh, X.-P. -
dc.contributor.author Guo, T. -
dc.contributor.author Mousavi, H.S. -
dc.contributor.author Vu, T.H. -
dc.contributor.author Monga, V. -
dc.contributor.author Cruz, C. -
dc.contributor.author Egiazarian, K. -
dc.contributor.author Katkovnik, V. -
dc.contributor.author Mehta, R. -
dc.contributor.author Jain, A.K. -
dc.contributor.author Agarwalla, A. -
dc.contributor.author Praveen, C.V.S. -
dc.contributor.author Zhou, R. -
dc.contributor.author Wen, H. -
dc.contributor.author Zhu, C. -
dc.contributor.author Xia, Z. -
dc.contributor.author Guo, Q. -
dc.date.accessioned 2023-12-19T18:38:47Z -
dc.date.available 2023-12-19T18:38:47Z -
dc.date.created 2021-08-19 -
dc.date.issued 2017-07 -
dc.description.abstract This paper reviews the first challenge on single image super-resolution (restoration of rich details in an low resolution image) with focus on proposed solutions and results. A new DIVerse 2K resolution image dataset (DIV2K) was employed. The challenge had 6 competitions divided into 2 tracks with 3 magnification factors each. Track 1 employed the standard bicubic downscaling setup, while Track 2 had unknown downscaling operators (blur kernel and decimation) but learnable through low and high res train images. Each competition had b∼100 registered participants and 20 teams competed in the final testing phase. They gauge the state-of-the-art in single image super-resolution. -
dc.identifier.bibliographicCitation IEEE Conference on Computer Vision and Pattern Recognition, pp.1110 - 1121 -
dc.identifier.doi 10.1109/CVPRW.2017.149 -
dc.identifier.issn 2160-7508 -
dc.identifier.scopusid 2-s2.0-85030220122 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/53622 -
dc.identifier.url https://ieeexplore.ieee.org/document/8014883 -
dc.language 영어 -
dc.publisher IEEE Computer Society -
dc.title NTIRE 2017 Challenge on Single Image Super-Resolution: Methods and Results -
dc.type Conference Paper -
dc.date.conferenceDate 2017-07-21 -

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