Full metadata record
DC Field | Value | Language |
---|---|---|
dc.citation.endPage | 19143 | - |
dc.citation.number | 29 | - |
dc.citation.startPage | 19134 | - |
dc.citation.title | ACS OMEGA | - |
dc.citation.volume | 6 | - |
dc.contributor.author | Hwang, Yunjae | - |
dc.contributor.author | Kim, Jisoo | - |
dc.contributor.author | Yim, Changyong | - |
dc.contributor.author | Park, Hyung Wook | - |
dc.date.accessioned | 2023-12-21T15:38:15Z | - |
dc.date.available | 2023-12-21T15:38:15Z | - |
dc.date.created | 2021-08-20 | - |
dc.date.issued | 2021-07 | - |
dc.description.abstract | Thermal oxidation resistance is an important property in printed electronics for sustaining electrical conductivity for long time and/or under harsh environments such as high temperature. This study reports the fabrication of copper nanoparticles (CuNPs)-based conductive tracks using large pulsed electron beam (LPEB) by irradiation on CuNPs to be sintered. With an acceleration voltage of 11 kV, the LPEB irradiation induced deep-sintering of CuNPs so that the sintered CuNPs exhibited bulk-like electrical conductivity. Consequently, the sintered Cu tracks maintained high electrical conductivity at 220 degrees C without using any thermal oxidation protection additive, such as silver, carbon nanotube, and graphene. In contrast, the films irradiated with an acceleration voltage of 8 kV and irradiated by intense pulsed light (IPL) showed fast oxidation characteristics and a corresponding reduction of electrical conductivities under high temperatures owing to a thin sintered layer. The performance of highly thermal oxidation-resistant Cu films sintered by LPEB irradiations was demonstrated through the device performance of a Joule heater. | - |
dc.identifier.bibliographicCitation | ACS OMEGA, v.6, no.29, pp.19134 - 19143 | - |
dc.identifier.doi | 10.1021/acsomega.1c02475 | - |
dc.identifier.issn | 2470-1343 | - |
dc.identifier.scopusid | 2-s2.0-85111324769 | - |
dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/53555 | - |
dc.identifier.url | https://pubs.acs.org/doi/10.1021/acsomega.1c02475 | - |
dc.identifier.wosid | 000679374200057 | - |
dc.language | 영어 | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | Deep-Sintered Copper Tracks for Thermal Oxidation Resistance Using Large Pulsed Electron Beam | - |
dc.type | Article | - |
dc.description.isOpenAccess | TRUE | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.type.docType | Article | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | EVAPORATED METAL-FILMS | - |
dc.subject.keywordPlus | MULTIPLE-SCATTERING | - |
dc.subject.keywordPlus | CONDUCTIVE INKS | - |
dc.subject.keywordPlus | NANOPARTICLES | - |
dc.subject.keywordPlus | TRANSPARENT | - |
dc.subject.keywordPlus | STEELS | - |
dc.subject.keywordPlus | LAYERS | - |
dc.subject.keywordPlus | LIGHT | - |
dc.subject.keywordPlus | FABRICATION | - |
dc.subject.keywordPlus | OXIDE | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Tel : 052-217-1404 / Email : scholarworks@unist.ac.kr
Copyright (c) 2023 by UNIST LIBRARY. All rights reserved.
ScholarWorks@UNIST was established as an OAK Project for the National Library of Korea.