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김제형

Kim, Je-Hyung
Solid-State Quantum Architecture Lab.
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dc.citation.number 1 -
dc.citation.title JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B -
dc.citation.volume 37 -
dc.contributor.author Richardson, Christopher J. K. -
dc.contributor.author Leavitt, Richard P. -
dc.contributor.author Kim, Je-Hyung -
dc.contributor.author Waks, Edo -
dc.contributor.author Arslan, Ilke -
dc.contributor.author Arey, Bruce -
dc.date.accessioned 2023-12-21T19:39:48Z -
dc.date.available 2023-12-21T19:39:48Z -
dc.date.created 2021-04-13 -
dc.date.issued 2019-01 -
dc.description.abstract Long-distance quantum communication relies on the ability to efficiently generate and prepare single photons at telecom wavelengths. Low-density InAs quantum dots on InP surfaces are grown in a molecular beam epitaxy system using a modified Stranski-Krastanov growth paradigm. This material is a source of bright and indistinguishable single photons in the 1.3 mu m telecom band. Here, the exploration of the growth parameters is presented as a phase diagram, while low-temperature photoluminescence and atomic resolution images are presented to correlate structure and spectral performance. This work identifies specific stacking faults and V-shaped defects that are likely causes of the observed low brightness emission at 1.55 mu m telecom wavelengths. The different locations of the imaged defects suggest possible guidance for future development of InAs/InP single photon sources for c-band, 1.55 mu m wavelength telecommunication systems. -
dc.identifier.bibliographicCitation JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, v.37, no.1 -
dc.identifier.doi 10.1116/1.5042540 -
dc.identifier.issn 1071-1023 -
dc.identifier.scopusid 2-s2.0-85059619456 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/52723 -
dc.identifier.wosid 000456825600004 -
dc.language 영어 -
dc.publisher American Institute of Physics -
dc.title Origin of spectral brightness variations in InAs/InP quantum dot telecom single photon emitters -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Physics, Applied -
dc.relation.journalResearchArea Engineering; Science & Technology - Other Topics; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordPlus 2-PHOTON INTERFERENCE -
dc.subject.keywordPlus INP -
dc.subject.keywordPlus EMISSION -
dc.subject.keywordPlus BAND -

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