dc.citation.conferencePlace |
US |
- |
dc.citation.conferencePlace |
Honolulu, Hawaii; USA |
- |
dc.citation.endPage |
73 |
- |
dc.citation.startPage |
72 |
- |
dc.citation.title |
IEEE Silicon Nanoelectronics Workshop |
- |
dc.contributor.author |
Kim, Kyung Rok |
- |
dc.contributor.author |
None |
- |
dc.date.accessioned |
2023-12-20T06:06:50Z |
- |
dc.date.available |
2023-12-20T06:06:50Z |
- |
dc.date.created |
2014-12-23 |
- |
dc.date.issued |
2003-06-21 |
- |
dc.identifier.bibliographicCitation |
IEEE Silicon Nanoelectronics Workshop, pp.72 - 73 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/52195 |
- |
dc.publisher |
IEEE Electron Device Society |
- |
dc.title |
Observation of Single-Electron Charging Effects Based on Band-to-band Tunneling in a MOS-based Single-Electron Transistor-'MOSET' |
- |
dc.type |
Conference Paper |
- |
dc.date.conferenceDate |
2003-06-21 |
- |