| dc.citation.conferencePlace |
KO |
- |
| dc.citation.conferencePlace |
Seoul |
- |
| dc.citation.endPage |
823 |
- |
| dc.citation.startPage |
822 |
- |
| dc.citation.title |
10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 |
- |
| dc.contributor.author |
Ha, S. |
- |
| dc.contributor.author |
Kim, B.-J. |
- |
| dc.contributor.author |
Kim, Y.-H. |
- |
| dc.contributor.author |
Yoon, Tae-Sik |
- |
| dc.contributor.author |
Kim, Y.-S. |
- |
| dc.contributor.author |
Lee, H.H. |
- |
| dc.date.accessioned |
2023-12-20T03:36:11Z |
- |
| dc.date.available |
2023-12-20T03:36:11Z |
- |
| dc.date.created |
2021-03-15 |
- |
| dc.date.issued |
2010-10-11 |
- |
| dc.description.abstract |
Transparent thin-film transistors (TTFTs) with an indium-zinc oxide (IZO) active layer doped with nitrogen by the solution-processed deposition method were fabricated and their TFTs characterizations were discussed. Heavily doped Si was used as a common gate and PECVD silicon nitride (SiNx) was used as a gate dielectric material for the TFT. The nitrogen doping had an effect of reducing the leakage current of the fabricated TFT. |
- |
| dc.identifier.bibliographicCitation |
10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010, pp.822 - 823 |
- |
| dc.identifier.issn |
1738-7558 |
- |
| dc.identifier.scopusid |
2-s2.0-79959975336 |
- |
| dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/50672 |
- |
| dc.language |
영어 |
- |
| dc.publisher |
IMID/IDMC/ASIA Display 2010 |
- |
| dc.title |
Fabrication of thin film transistor with solution-processed nitrogen doped indium-zinc oxide |
- |
| dc.type |
Conference Paper |
- |
| dc.date.conferenceDate |
2010-10-11 |
- |