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윤태식

Yoon, Tae-Sik
Nano Semiconductor Research Lab.
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dc.citation.conferencePlace KO -
dc.citation.conferencePlace Seoul -
dc.citation.endPage 823 -
dc.citation.startPage 822 -
dc.citation.title 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010 -
dc.contributor.author Ha, S. -
dc.contributor.author Kim, B.-J. -
dc.contributor.author Kim, Y.-H. -
dc.contributor.author Yoon, Tae-Sik -
dc.contributor.author Kim, Y.-S. -
dc.contributor.author Lee, H.H. -
dc.date.accessioned 2023-12-20T03:36:11Z -
dc.date.available 2023-12-20T03:36:11Z -
dc.date.created 2021-03-15 -
dc.date.issued 2010-10-11 -
dc.description.abstract Transparent thin-film transistors (TTFTs) with an indium-zinc oxide (IZO) active layer doped with nitrogen by the solution-processed deposition method were fabricated and their TFTs characterizations were discussed. Heavily doped Si was used as a common gate and PECVD silicon nitride (SiNx) was used as a gate dielectric material for the TFT. The nitrogen doping had an effect of reducing the leakage current of the fabricated TFT. -
dc.identifier.bibliographicCitation 10th International Meeting on Information Display and International Display Manufacturing Conference and Asia Display 2010, IMID/IDMC/ASIA Display 2010, pp.822 - 823 -
dc.identifier.issn 1738-7558 -
dc.identifier.scopusid 2-s2.0-79959975336 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/50672 -
dc.language 영어 -
dc.publisher IMID/IDMC/ASIA Display 2010 -
dc.title Fabrication of thin film transistor with solution-processed nitrogen doped indium-zinc oxide -
dc.type Conference Paper -
dc.date.conferenceDate 2010-10-11 -

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