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Chung, Moses
Intense Beam and Accelerator Lab.
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dc.citation.number 3 -
dc.citation.startPage 033303 -
dc.citation.title REVIEW OF SCIENTIFIC INSTRUMENTS -
dc.citation.volume 92 -
dc.contributor.author Arutunian, S.G. -
dc.contributor.author Margaryan, A.V. -
dc.contributor.author Harutyunyan, G.S. -
dc.contributor.author Lazareva, E.G. -
dc.contributor.author Darpasyan, A.T. -
dc.contributor.author Gyulamiryan, D.S. -
dc.contributor.author Chung, Moses -
dc.contributor.author Kwak, D. -
dc.date.accessioned 2023-12-21T16:11:02Z -
dc.date.available 2023-12-21T16:11:02Z -
dc.date.created 2021-03-24 -
dc.date.issued 2021-03 -
dc.description.abstract A new method for profile measurements of small transverse size beams by means of a vibrating wire is presented. A vibrating wire resonator with a new magnetic system was developed and manufactured to ensure that the wire oscillated in a single plane. Presented evidence gives us confidence that the autogenerator creates vibrations at the natural frequency of the wire in a plane of the magnetic system, and these vibrations are sinusoidal. The system for measuring the laser beam reflected from the vibrating wire by means of a fast photodiode was upgraded. The experiments allowed the reconstruction of a fine structure of the focused beam of the semiconductor laser using only a few vibrating wire oscillations. The system presented here would eventually enable the implementation of tomographic measurements of the thin beam profile. -
dc.identifier.bibliographicCitation REVIEW OF SCIENTIFIC INSTRUMENTS, v.92, no.3, pp.033303 -
dc.identifier.doi 10.1063/5.0028666 -
dc.identifier.issn 0034-6748 -
dc.identifier.scopusid 2-s2.0-85102012595 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/50564 -
dc.identifier.url https://aip.scitation.org/doi/10.1063/5.0028666 -
dc.identifier.wosid 000630506400003 -
dc.language 영어 -
dc.publisher AMER INST PHYSICS -
dc.title Characterization of micrometer-size laser beam using a vibrating wire as a miniature scanner -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Instruments & Instrumentation; Physics, Applied -
dc.relation.journalResearchArea Instruments & Instrumentation; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -

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