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Yoon, Tae-Sik
Nano Semiconductor Research Lab.
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dc.citation.endPage 4323 -
dc.citation.number 13 -
dc.citation.startPage 4319 -
dc.citation.title THIN SOLID FILMS -
dc.citation.volume 519 -
dc.contributor.author Kim, Bong-Jin -
dc.contributor.author Kim, Hyung-Jun -
dc.contributor.author Jung, Sung-Mok -
dc.contributor.author Kim, Yo-Han -
dc.contributor.author Ha, Sanghyub -
dc.contributor.author Yoon, Tae-Sik -
dc.contributor.author Lee, Hyun Ho -
dc.date.accessioned 2023-12-22T06:11:44Z -
dc.date.available 2023-12-22T06:11:44Z -
dc.date.created 2021-03-06 -
dc.date.issued 2011-04 -
dc.description.abstract Capacitance-voltage (C-V) behaviors of metal-polymer-silicon capacitors having inkjet-printed silver (Ag) electrodes were characterized. Polymers of polyvinyl alcohol (PVA) and poly-4-vinylphenol (PVP) were spin-coated on heavily doped silicon for dielectric layer, on which Ag ink was directly patterned. The C-V characteristics of inkjet-printed Ag devices were compared with those of evaporated Al devices. Cross-linked PVA device (1000 s UV exposure) with inkjet-printed Ag electrode showed higher capacitance and dielectric constant (366 pF, k = 5.10) than the device with evaporated Al electrode (109 pF, k = 1.57, 1 mm radius). For the PVP dielectric layer, device with inkjet-printed Ag showed lower capacitance and dielectric constant than evaporated Al device. Interface states between the polymer dielectrics and metal electrodes were investigated by scanning electron microscopy. In addition, cross-linking of PVA with UV exposure, confirmed by Fourier transformed infrared spectroscopy, critically influenced the flat band voltage for both inkjet-printed and evaporated electrode's devices. Chemical composition of Ag electrode was analyzed by x-ray photoelectron spectroscopy. In summary, it was found that degree of cross-linking, interface states between polymer and electrode, and chemical composition of electrode could determine electrical performances, respectively. (c) 2011 Elsevier By. All rights reserved. -
dc.identifier.bibliographicCitation THIN SOLID FILMS, v.519, no.13, pp.4319 - 4323 -
dc.identifier.doi 10.1016/j.tsf.2011.02.035 -
dc.identifier.issn 0040-6090 -
dc.identifier.scopusid 2-s2.0-79954449012 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/50272 -
dc.identifier.wosid 000290187100033 -
dc.language 영어 -
dc.publisher ELSEVIER SCIENCE SA -
dc.title Capacitance-voltage characteristics of metal-polymer-silicon device with inkjet-printed Ag electrode -
dc.type Article -
dc.description.isOpenAccess FALSE -
dc.relation.journalWebOfScienceCategory Materials Science, Multidisciplinary; Materials Science, Coatings & Films; Physics, Applied; Physics, Condensed Matter -
dc.relation.journalResearchArea Materials Science; Physics -
dc.type.docType Article -
dc.description.journalRegisteredClass scie -
dc.description.journalRegisteredClass scopus -
dc.subject.keywordAuthor Silver -
dc.subject.keywordAuthor Inkjet printing -
dc.subject.keywordAuthor Capacitors -
dc.subject.keywordAuthor Flexible substrates -
dc.subject.keywordAuthor Polyvinyl alcohol -
dc.subject.keywordAuthor Poly-4-vinylphenol -
dc.subject.keywordPlus THIN-FILM TRANSISTORS -
dc.subject.keywordPlus X-RAY-SCATTERING -
dc.subject.keywordPlus HYBRIDS -
dc.subject.keywordPlus LAYERS -

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