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Lee, Zonghoon
Atomic-Scale Electron Microscopy Lab.
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dc.citation.endPage 4303 -
dc.citation.number 14 -
dc.citation.startPage 4296 -
dc.citation.title ACTA MATERIALIA -
dc.citation.volume 57 -
dc.contributor.author Ophus, C. -
dc.contributor.author Luber, E. J. -
dc.contributor.author Edelen, M. -
dc.contributor.author Lee, Zonghoon -
dc.contributor.author Fischer, L. M. -
dc.contributor.author Evoy, S. -
dc.contributor.author Lewis, D. -
dc.contributor.author Dahmen, U. -
dc.contributor.author Radmilovic, V. -
dc.contributor.author Mitlin, D. -
dc.date.accessioned 2023-12-22T07:42:26Z -
dc.date.available 2023-12-22T07:42:26Z -
dc.date.created 2014-06-23 -
dc.date.issued 2009-08 -
dc.description.abstract We investigate the bulk and surface features of the crystalline-amorphous transitions in binary Al-Mo alloy thin films as a function of Mo composition using transmission electron microscopy, X-ray diffraction and atomic force microscopy analysis, as well as thermodynamic modeling. Of the alloys tested, the minimum in the root mean square (rms) surface roughness and correlation length occurs at the Al-32 at.% Mo composition, which corresponds to the maximum volume fraction of the amorphous phase and the minimum volume fraction of the body centered cubic nanocrystallites. The rms surface roughness of the 32 at.% Mo films is on the order of a single nanometer, compared with nearly 80 nm for the 50 at.% Mo film. A structure-zone map is constructed to relate the surface morphology of the films to their bulk microstructure. A thermodynamic model developed by Miedema and coworkers was used to predict the general trends observed in the microstructural evolution as a function of film composition. Published by Elsevier Ltd on behalf of Acta Materialia Inc. -
dc.identifier.bibliographicCitation ACTA MATERIALIA, v.57, no.14, pp.4296 - 4303 -
dc.identifier.doi 10.1016/j.actamat.2009.05.029 -
dc.identifier.issn 1359-6454 -
dc.identifier.scopusid 2-s2.0-67650168866 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/5022 -
dc.identifier.url http://www.scopus.com/inward/record.url?partnerID=HzOxMe3b&scp=67650168866 -
dc.identifier.wosid 000268653000033 -
dc.language 영어 -
dc.publisher PERGAMON-ELSEVIER SCIENCE LTD -
dc.title Nanocrystalline-amorphous transitions in Al-Mo thin films: Bulk and surface evolution -
dc.type Article -
dc.description.journalRegisteredClass scopus -

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