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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.endPage 10 -
dc.citation.number 1 -
dc.citation.startPage 6 -
dc.citation.title IDEC Journal of Integrated Circuits and Systems -
dc.citation.volume 7 -
dc.contributor.author Jeong, Sang Yeong -
dc.contributor.author Park, Jun Sik -
dc.contributor.author Kim, Jingook -
dc.date.accessioned 2023-12-21T16:36:25Z -
dc.date.available 2023-12-21T16:36:25Z -
dc.date.created 2021-02-01 -
dc.date.issued 2021-01 -
dc.description.abstract This paper proposes the integrated circuit (IC) within the active EMI filter (AEF). The fully-isolated feed-forward current-sense current-compensation (CSCC) structure of the AEF is also proposed to achieve the robust reliability from electromagnetic susceptibility (EMS) to the designed IC. The noise attenuation performance is analyzed, and the design guides for the proposed AEF with IC are developed. The designed IC is fabricated by 180nm BCD process. The noise attenuation performance and stability are experimentally validated by vector network analyzer (VNA) measurement. -
dc.identifier.bibliographicCitation IDEC Journal of Integrated Circuits and Systems, v.7, no.1, pp.6 - 10 -
dc.identifier.doi 10.23075/jicas.2021.7.1.002 -
dc.identifier.issn 2384-2113 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/49930 -
dc.identifier.url https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART002665141 -
dc.language 영어 -
dc.publisher 반도체설계교육센터 -
dc.title.alternative Compact Active EMI Filter for Reduction of CM Conducted Emission in High Power System Implemented by the Integrated Circuit -
dc.title Compact Active EMI Filter for Reduction of CM Conducted Emission in High Power System Implemented by the Integrated Circuit -
dc.type Article -
dc.description.isOpenAccess TRUE -
dc.identifier.kciid ART002665141 -
dc.type.docType Article -
dc.description.journalRegisteredClass kci -
dc.subject.keywordAuthor Active EMI filter (AEF) -
dc.subject.keywordAuthor Bipolar-CMOS-DMOS (BCD) process -
dc.subject.keywordAuthor Conducted Emission (CE) -
dc.subject.keywordAuthor Electromagnetic interference (EMI) -
dc.subject.keywordAuthor Integrated Circuits (ICs) -

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