Power Hardware-in-The- Loop Simulation for DC Microgrid Reliability Test
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- Power Hardware-in-The- Loop Simulation for DC Microgrid Reliability Test
- Heo, Kyoung-Wook; Choi, Hyun-Jun; Jung, Jee-Hoon
- Issue Date
- IEEE Power Electronics Society
- IEEE International Power Electronics and Motion Control Conference
- As the efficient usage of energy in the grid becomes more important than before, diverse power sources, such as distributed renewable energies, are linked to DC microgrid. Therefore, the reliability test of the entire microgrid is essential. However, configuring the real DC grid to test its reliability takes a lot of time and cost. In this paper, a 20-kW DC microgrid is modeled by using the Power Hardware-in-the-Loop (PHIL) simulation technique, which verifies the feasibility of the DBS algorithm. Through the PHIL simulation test technique, the proposed testbed can simulate the overall operation of the DC microgrid. Furthermore, depending on the DC bus voltage, the operations of the grid-connected converter can be verified, and the DC bus voltage control ability through seamless mode transition can be validated under the grid failure. Finally, the proposed testbed shows the reliability of the DC microgrid using the PHIL simulation tests with a 3-kW prototype converter.
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