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- Kim, Jingook
- Integrated Circuit and Electromagnetic Compatibility Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | 2015 EOS/ESD Symposium for Factory Issues | - |
| dc.contributor.author | Kim, Jingook | - |
| dc.date.accessioned | 2023-12-19T22:09:44Z | - |
| dc.date.available | 2023-12-19T22:09:44Z | - |
| dc.date.created | 2015-07-01 | - |
| dc.date.issued | 2015-06-30 | - |
| dc.identifier.bibliographicCitation | 2015 EOS/ESD Symposium for Factory Issues | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/47003 | - |
| dc.language | 영어 | - |
| dc.publisher | EOS/ESD Symposium | - |
| dc.title | Calculation and Measurement of System Level ESD Coupling using PEEC method | - |
| dc.type | Conference Paper | - |
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