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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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dc.citation.conferencePlace CN -
dc.citation.conferencePlace Toronto -
dc.citation.endPage 974 -
dc.citation.startPage 971 -
dc.citation.title 2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014 -
dc.contributor.author Ryu, Min Woo -
dc.contributor.author Lee, Jeong Seop -
dc.contributor.author Kim, Kyung Rok -
dc.date.accessioned 2023-12-19T23:37:48Z -
dc.date.available 2023-12-19T23:37:48Z -
dc.date.created 2015-01-20 -
dc.date.issued 2014-08-21 -
dc.description.abstract In principle, the photoresponse can be enhanced by scaling down the gate oxide thickness (tox), which is a key structural parameter for the channel 2DEG density modulation. By using our TCAD simulation framework, we found that the enhanced photoresponse by reducing tox has been originated from the increase of 2DEG density modulation by the improved subthreshold swing (SSW) of FET and the decrease of 2DEG propagation length (i.e. more asymmetric 2DEG) by degradation of the normal field-dependent channel mobility. -
dc.identifier.bibliographicCitation 2014 14th IEEE International Conference on Nanotechnology, IEEE-NANO 2014, pp.971 - 974 -
dc.identifier.doi 10.1109/NANO.2014.6968154 -
dc.identifier.isbn 978-147995622-7 -
dc.identifier.scopusid 2-s2.0-84919474509 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/46910 -
dc.identifier.url http://ieeexplore.ieee.org/xpl/abstractKeywords.jsp?arnumber=6968154 -
dc.language 영어 -
dc.publisher IEEE -
dc.title Physical modeling and analysis for performance enhancement of nanoscale silicon field-effect transistor-based plasmonic terahertz detector -
dc.type Conference Paper -
dc.date.conferenceDate 2014-08-18 -

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