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Kim, Kyung Rok
Nano-Electronic Emerging Devices Lab.
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dc.citation.conferencePlace US -
dc.citation.endPage 218 -
dc.citation.startPage 217 -
dc.citation.title Device Research Conference - Conference Digest, 62nd DRC -
dc.contributor.author Kim, Kyung Rok -
dc.contributor.author Kim, Hyun Ho -
dc.contributor.author Song, Ki-Whan -
dc.contributor.author Huh, Jung Im -
dc.contributor.author Lee, Jong Duk -
dc.contributor.author Park, Byung-Gook -
dc.date.accessioned 2023-12-20T05:39:44Z -
dc.date.available 2023-12-20T05:39:44Z -
dc.date.created 2014-12-23 -
dc.date.issued 2004-06-21 -
dc.description.abstract The fabrication of quantum-tunneling devices based on silicon (Si) technology was described. Channel and gate patterning were performed by electron beam lithography with hydrogen silsesquioxane (HSQ) and scanning electron microscopy (SEM) images. It was observed that the peak tunneling current increases according to the channel width increase due to the increment of tunneling area. It was found that the field-effect mechanisms reasonably affect the output characteristics of field-induced band-to-band tunneling effect transistor (FIBTET). -
dc.identifier.bibliographicCitation Device Research Conference - Conference Digest, 62nd DRC, pp.217 - 218 -
dc.identifier.doi 10.1109/DRC.2004.1367872 -
dc.identifier.issn 1548-3770 -
dc.identifier.scopusid 2-s2.0-18044364403 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/46888 -
dc.identifier.url https://ieeexplore.ieee.org/document/1367872 -
dc.language 영어 -
dc.publisher Device Research Conference - Conference Digest, 62nd DRC -
dc.title SOI MOSFET-Based Quantum Tunneling Device - FIBTET -
dc.type Conference Paper -
dc.date.conferenceDate 2004-06-21 -

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