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김예린

Kim, Katherine A.
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dc.citation.conferencePlace US -
dc.citation.conferencePlace Fort Worth, TX -
dc.citation.endPage 1231 -
dc.citation.startPage 1223 -
dc.citation.title 26th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2011 -
dc.contributor.author Kim, Katherine A. -
dc.contributor.author Johnson, Brian B. -
dc.contributor.author Bazzi, Ali M. -
dc.contributor.author Krein, Philip T. -
dc.contributor.author Dominguez-García, Alejandro -
dc.date.accessioned 2023-12-20T03:07:53Z -
dc.date.available 2023-12-20T03:07:53Z -
dc.date.created 2015-07-01 -
dc.date.issued 2011-03-10 -
dc.description.abstract This paper introduces a generalized reliability model of a solar power unit (SPU) based on physical characteristics including material, operating conditions, and electrical ratings. An SPU includes a photovoltaic panel, power converter, control and sensing. Possible faults in each component of the unit are surveyed and their failure rates based on physics-of-failure models are formulated. PV panel faults include possible installation faults, environmental effects, and material degradation. Power electronics faults are developed in depth for different components of a dc-dc boost converter. A systemlevel simulation model is developed and verified experimentally, and then used to define the survivor function of the SPU. Results show that it is important to include panel faults for accurate reliability values. The developed model is flexible and can be tailored for various SPU operating conditions, panel designs, and electrical ratings. The proposed reliability model can be extended to parallel and series interconnected topologies of multiple SPUs. -
dc.identifier.bibliographicCitation 26th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2011, pp.1223 - 1231 -
dc.identifier.doi 10.1109/APEC.2011.5744749 -
dc.identifier.scopusid 2-s2.0-79955783982 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/46818 -
dc.identifier.url https://ieeexplore.ieee.org/document/5744749 -
dc.language 영어 -
dc.publisher 26th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2011 -
dc.title Fault impacts on solar power unit reliability -
dc.type Conference Paper -
dc.date.conferenceDate 2011-03-06 -

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