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- Kim, Katherine A.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.conferencePlace | Denver, CO | - |
| dc.citation.endPage | 1014 | - |
| dc.citation.startPage | 1007 | - |
| dc.citation.title | 5th Annual IEEE Energy Conversion Congress and Exhibition, ECCE 2013 | - |
| dc.contributor.author | Kim, Katherine A. | - |
| dc.contributor.author | Krein, PT | - |
| dc.date.accessioned | 2023-12-20T00:38:57Z | - |
| dc.date.available | 2023-12-20T00:38:57Z | - |
| dc.date.created | 2015-07-01 | - |
| dc.date.issued | 2013-09-18 | - |
| dc.description.abstract | Hot spots are a common problem in photovoltaic (PV) panels that accelerate cell degradation and reduce system performance. Hot spots occur when a cell is reversed biased, sinks power, and heats the cell. At a certain threshold, the PV p-n junction goes into second breakdown and heats a small portion of the cell to very high temperatures. This study experimentally tests mono-crystalline Si cells as they hot spot at different power levels. Heating effects on the I-V characteristics during hot spotting and permanent changes after seven days of hour-long hot spot tests are observed and analyzed. I-V characteristics are significantly affected under second breakdown, which is observed when cells are reverse-biased above two times the rated maximum power level. | - |
| dc.identifier.bibliographicCitation | 5th Annual IEEE Energy Conversion Congress and Exhibition, ECCE 2013, pp.1007 - 1014 | - |
| dc.identifier.doi | 10.1109/ECCE.2013.6646813 | - |
| dc.identifier.scopusid | 2-s2.0-84891072790 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/46760 | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/6646813 | - |
| dc.language | 영어 | - |
| dc.publisher | 5th Annual IEEE Energy Conversion Congress and Exhibition, ECCE 2013 | - |
| dc.title | Hot spotting and second breakdown effects on reverse I-V characteristics for mono-crystalline Si photovoltaics | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2013-09-15 | - |
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