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dc.citation.conferencePlace CH -
dc.citation.conferencePlace Taipei -
dc.citation.endPage 831 -
dc.citation.startPage 825 -
dc.citation.title Asia and South Pacific Design Automation Conference -
dc.contributor.author Kahng, Andrew B. -
dc.contributor.author Kang, Seokhyeong -
dc.contributor.author Kumar, Rakesh -
dc.contributor.author Sartori, John -
dc.date.accessioned 2023-12-20T03:39:59Z -
dc.date.available 2023-12-20T03:39:59Z -
dc.date.created 2015-07-01 -
dc.date.issued 2010-01-18 -
dc.description.abstract Modern digital IC designs have a critical operating point, or “wall of slack”, that limits voltage scaling. Even with an error-tolerance mechanism, scaling voltage below a critical voltage - so-called overscaling - results in more timing errors than can be effectively detected or corrected. This limits the effectiveness of voltage scaling in trading off system reliability and power. We propose a design-level approach to trading off reliability and voltage (power) in, e.g., microprocessor designs. We increase the range of voltage values at which the (timing) error rate is acceptable; we achieve this through techniques for power-aware slack redistribution that shift the timing slack of frequently-exercised, near-critical timing paths in a power- and area-efficient manner. The resulting designs heuristically minimize the voltage at which the maximum allowable error rate is encountered, thus minimizing power consumption for a prescribed maximum error rate and allowing the design to fail more gracefully. Compared with baseline designs, we achieve a maximum of 32.8% and an average of 12.5% power reduction at an error rate of 2%. The area overhead of our techniques, as evaluated through physical implementation (synthesis, placement and routing), is no more than 2.7%. -
dc.identifier.bibliographicCitation Asia and South Pacific Design Automation Conference, pp.825 - 831 -
dc.identifier.doi 10.1109/ASPDAC.2010.5419690 -
dc.identifier.scopusid 2-s2.0-77951223419 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/46632 -
dc.identifier.url http://ieeexplore.ieee.org/document/5419690/ -
dc.language 영어 -
dc.publisher 2010 15th Asia and South Pacific Design Automation Conference, ASP-DAC 2010 -
dc.title Slack Redistribution for Graceful Degradation Under Voltage Overscaling -
dc.type Conference Paper -
dc.date.conferenceDate 2010-01-18 -

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