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dc.citation.conferencePlace FR -
dc.citation.conferencePlace Grenoble -
dc.citation.endPage 1214 -
dc.citation.startPage 1209 -
dc.citation.title Design Automation and Test in Europe Conference -
dc.contributor.author Kahng, Andrew B. -
dc.contributor.author Kang, Seokhyeong -
dc.contributor.author Park, Bongil -
dc.date.accessioned 2023-12-20T01:08:33Z -
dc.date.available 2023-12-20T01:08:33Z -
dc.date.created 2015-07-01 -
dc.date.issued 2013-03-18 -
dc.description.abstract Power gating is one of the most effective solutions available to reduce leakage power. However, power gating is not practically usable in an active mode due to the overheads of inrush current and data retention. In this work, we propose a data-retained power gating (DRPG) technique which enables power gating of flip-flops during active mode. More precisely, we combine clock gating and power gating techniques, with the flip-flops being power-gated during clock masked periods. We introduce a retention switch which retains data during the power gating. With the retention switch, correct logic states and functionalities are guaranteed without additional control circuitry. The proposed technique can achieve significant active-mode leakage reduction over conventional designs with small area and performance overheads. In studies with a 65nm foundry library and open-source benchmarks, DRPG achieves up to 25.7% active-mode leakage savings (11.8% savings on average) over conventional designs. -
dc.identifier.bibliographicCitation Design Automation and Test in Europe Conference, pp.1209 - 1214 -
dc.identifier.doi 10.7873/DATE.2013.251 -
dc.identifier.issn 1530-1591 -
dc.identifier.scopusid 2-s2.0-84885619398 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/46619 -
dc.identifier.url http://ieeexplore.ieee.org/document/6513697/ -
dc.language 영어 -
dc.publisher 16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013 -
dc.title Active-Mode Leakage Reduction with Data-Retained Power Gating -
dc.type Conference Paper -
dc.date.conferenceDate 2013-03-18 -

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