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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | International Symposium on Carbon Electronics (ISCE) 2012 | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-20T02:10:56Z | - |
| dc.date.available | 2023-12-20T02:10:56Z | - |
| dc.date.created | 2013-10-10 | - |
| dc.date.issued | 2012 | - |
| dc.identifier.bibliographicCitation | International Symposium on Carbon Electronics (ISCE) 2012 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/46087 | - |
| dc.language | 영어 | - |
| dc.publisher | Seoul National University | - |
| dc.title | Graphene Research at Atomic Scale using Low kV Aberration-Corrected TEM | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2012 | - |
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