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DC Field Value Language
dc.citation.conferencePlace CC -
dc.citation.conferencePlace Zhangjiajie -
dc.citation.title IEEE PHM conference -
dc.contributor.author Kwon, Daeil -
dc.date.accessioned 2023-12-19T23:37:43Z -
dc.date.available 2023-12-19T23:37:43Z -
dc.date.created 2015-07-16 -
dc.date.issued 2014-08-25 -
dc.identifier.bibliographicCitation IEEE PHM conference -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/44849 -
dc.language 영어 -
dc.publisher IEEE -
dc.title Advances and Challenges in PHM Based Risk Assessment of Electronics Systems -
dc.type Conference Paper -
dc.date.conferenceDate 2014-08-24 -

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