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- Shin, Heungjoo
- Micro/Nano Integrated Systems Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | AU | - |
| dc.citation.conferencePlace | Linz | - |
| dc.citation.title | Agilent Technologies IX Annual Linz Winter Workshop | - |
| dc.contributor.author | Shin, Heungjoo | - |
| dc.contributor.author | None | - |
| dc.date.accessioned | 2023-12-20T05:06:48Z | - |
| dc.date.available | 2023-12-20T05:06:48Z | - |
| dc.date.created | 2014-12-23 | - |
| dc.date.issued | 2007-02-05 | - |
| dc.identifier.bibliographicCitation | Agilent Technologies IX Annual Linz Winter Workshop | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/43075 | - |
| dc.language | 영어 | - |
| dc.publisher | Agilent Technologies | - |
| dc.title | Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) Combined with Alternating Current Measurements | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2007-02-02 | - |
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