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- Shin, Heungjoo
- Micro/Nano Integrated Systems Lab.
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Atomic Force-Scanning Electrochemical Microscopy (AFM-SECM) Combined with Alternating Current Measurements
- Author(s)
- Shin, Heungjoo, None
- Issued Date
- 2007-02-05
- Citation
- Agilent Technologies IX Annual Linz Winter Workshop
- Publisher
- Agilent Technologies
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