dc.citation.conferencePlace |
JA |
- |
dc.citation.conferencePlace |
Toyama |
- |
dc.citation.title |
28th International Microprocesses and Nanotechnology Conference |
- |
dc.contributor.author |
Shin, Sunhae |
- |
dc.contributor.author |
Kim, Kyung Rok |
- |
dc.date.accessioned |
2023-12-19T21:36:47Z |
- |
dc.date.available |
2023-12-19T21:36:47Z |
- |
dc.date.created |
2015-11-26 |
- |
dc.date.issued |
2015-11-12 |
- |
dc.identifier.bibliographicCitation |
28th International Microprocesses and Nanotechnology Conference |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/42555 |
- |
dc.language |
영어 |
- |
dc.publisher |
The Japan Society of Applied Physics |
- |
dc.title |
New analysis of 6T-SRAM and its extensibility to multi-bit SRAM based on negative differential resistance and transconductance characteristics |
- |
dc.type |
Conference Paper |
- |
dc.date.conferenceDate |
2015-11-10 |
- |