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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | 제주 | - |
| dc.citation.title | 14th international union of materials research societies international conference on advanced materials | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.contributor.author | Kim, Kangsik | - |
| dc.date.accessioned | 2023-12-19T21:38:30Z | - |
| dc.date.available | 2023-12-19T21:38:30Z | - |
| dc.date.created | 2016-01-13 | - |
| dc.date.issued | 2015-10-28 | - |
| dc.identifier.bibliographicCitation | 14th international union of materials research societies international conference on advanced materials | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/41756 | - |
| dc.language | 영어 | - |
| dc.publisher | International Union of Materials Research Societies | - |
| dc.title | TEM Analyses of Plasma Enhanced Atomic Layer Deposition | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2015-10-25 | - |
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