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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.conferencePlace | Jeju | - |
| dc.citation.title | International Conference on materials and reliability | - |
| dc.contributor.author | Kwon, Daeil | - |
| dc.contributor.author | Yoon, Jeongah | - |
| dc.date.accessioned | 2023-12-19T21:36:12Z | - |
| dc.date.available | 2023-12-19T21:36:12Z | - |
| dc.date.created | 2015-12-28 | - |
| dc.date.issued | 2015-11-24 | - |
| dc.identifier.bibliographicCitation | International Conference on materials and reliability | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/41613 | - |
| dc.language | 영어 | - |
| dc.publisher | International Conference on materials and reliability | - |
| dc.title | A Model-based Prognostic Approach to Predict Remaining Useful Life of Inter-connects using Impedance Analysis | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2015-11-23 | - |
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