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김진국

Kim, Jingook
Integrated Circuit and Electromagnetic Compatibility Lab.
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dc.citation.conferencePlace US -
dc.citation.title DesignCon 2015 -
dc.contributor.author Kim, K -
dc.contributor.author Kim, Jingook -
dc.contributor.author Kim, H -
dc.contributor.author Kim, J -
dc.date.accessioned 2023-12-19T23:06:29Z -
dc.date.available 2023-12-19T23:06:29Z -
dc.date.created 2016-09-07 -
dc.date.issued 2015-01 -
dc.description.abstract Analytical approaches are proposed for the estimations of the worst case and statistical eye diagrams in high bandwidth memory (HBM) channels. The target HBM channels consist of the transceiver (Tx) drivers, symmetric coupled channel, and capacitance loads. The proposed estimation methods include the Tx power noise and channel crosstalk in their estimation procedures. Based on the proposed analytical approaches, we can obtain the fast estimation time for the eye diagrams and the physical insight into the distortion in the eye diagrams caused by the Tx power noise and channel crosstalk. The proposed analytical approaches are validated by comparisons with HSPICE simulations. -
dc.identifier.bibliographicCitation DesignCon 2015 -
dc.identifier.scopusid 2-s2.0-84983115053 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/41166 -
dc.language 영어 -
dc.publisher DesignCon 2015 -
dc.title Analytical approaches for worst and statistical eye estimation in HBM channel -
dc.type Conference Paper -
dc.date.conferenceDate 2015-01-27 -

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