dc.citation.conferencePlace |
KO |
- |
dc.citation.conferencePlace |
서울대학교 글로벌공학교육센터 |
- |
dc.citation.title |
Jeol Korea Users Meeting 2015, Electron Microscope and Analytical Instruments Joint Workshop |
- |
dc.contributor.author |
Kwon, Oh Hoon |
- |
dc.date.accessioned |
2023-12-19T22:36:13Z |
- |
dc.date.available |
2023-12-19T22:36:13Z |
- |
dc.date.created |
2017-01-07 |
- |
dc.date.issued |
2015-05-28 |
- |
dc.identifier.bibliographicCitation |
Jeol Korea Users Meeting 2015, Electron Microscope and Analytical Instruments Joint Workshop |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/40387 |
- |
dc.language |
영어 |
- |
dc.publisher |
지올코리아 |
- |
dc.title |
Ultrafast Electron Microscopy: Principle and Demonstrations in Chemical and Materials Dynamics |
- |
dc.type |
Conference Paper |
- |
dc.date.conferenceDate |
2015-05-27 |
- |