dc.citation.conferencePlace |
US |
- |
dc.citation.conferencePlace |
Columbus, Ohio |
- |
dc.citation.title |
Microscopy&Microanalysis 2016 |
- |
dc.contributor.author |
Kim, Na Yeon |
- |
dc.contributor.author |
Lee, Zonghoon |
- |
dc.date.accessioned |
2023-12-19T20:36:07Z |
- |
dc.date.available |
2023-12-19T20:36:07Z |
- |
dc.date.created |
2017-01-10 |
- |
dc.date.issued |
2016-07-25 |
- |
dc.identifier.bibliographicCitation |
Microscopy&Microanalysis 2016 |
- |
dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/40240 |
- |
dc.language |
영어 |
- |
dc.publisher |
Microscopy Society of America |
- |
dc.title |
Microstructural Investigation on Degradation Mechanism of Layered LiNi0.6Co0.2Mn0.2O2 Cathode Materials by Analytical TEM/STEM |
- |
dc.type |
Conference Paper |
- |
dc.date.conferenceDate |
2016-07-24 |
- |