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- Jeong, Hu Young
- UCRF Electron Microscopy group
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Microscopy and Microanalysis 2016 | - |
| dc.contributor.author | Kim, Sung Kyu | - |
| dc.contributor.author | Lee, Jeong Yong | - |
| dc.contributor.author | Jeong, Hu Young | - |
| dc.date.accessioned | 2023-12-19T20:12:10Z | - |
| dc.date.available | 2023-12-19T20:12:10Z | - |
| dc.date.created | 2017-01-10 | - |
| dc.date.issued | 2016-07-27 | - |
| dc.identifier.bibliographicCitation | Microscopy and Microanalysis 2016 | - |
| dc.identifier.doi | 10.1017/S1431927616008886 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/40239 | - |
| dc.language | 영어 | - |
| dc.publisher | Microscopy Society of America | - |
| dc.title | Direct Observation of Conducting Path with Highly Reduced Graphene Oxide in Au/GO/Al Resistive Switching Memory | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2016-07-24 | - |
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