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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | CC | - |
| dc.citation.conferencePlace | 중국 | - |
| dc.citation.title | International Symposium on Microscopy and Microanalysis of Materials 2016 | - |
| dc.contributor.author | Lee, Sukwoo | - |
| dc.contributor.author | Park, Hyo Ju | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-19T20:08:56Z | - |
| dc.date.available | 2023-12-19T20:08:56Z | - |
| dc.date.created | 2017-01-10 | - |
| dc.date.issued | 2016-09-23 | - |
| dc.identifier.bibliographicCitation | International Symposium on Microscopy and Microanalysis of Materials 2016 | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/40218 | - |
| dc.language | 영어 | - |
| dc.publisher | International Symposium on Microscopy and Microanalysis of Materials | - |
| dc.title | Epitaxial growth of thckness controllable microplate copper phosphide (Cu3P) on Cu (100) foil | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2016-09-23 | - |
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