File Download
There are no files associated with this item.
SFX Link
- Find it @ UNIST can give you direct access to the published full text of this article. (UNISTARs only)
- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
Views & Downloads
Detailed Information
Cited time in 
Cited time in 
Cited time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | The 10th International Conference on Advanced Materials and Devices | - |
| dc.contributor.author | 김강식 | - |
| dc.contributor.author | 김정화 | - |
| dc.contributor.author | 윤종찬 | - |
| dc.contributor.author | 이석우 | - |
| dc.contributor.author | 윤아람 | - |
| dc.contributor.author | 이종훈 | - |
| dc.date.accessioned | 2023-12-19T17:38:41Z | - |
| dc.date.available | 2023-12-19T17:38:41Z | - |
| dc.date.created | 2017-11-14 | - |
| dc.date.issued | 2017-12-07 | - |
| dc.identifier.bibliographicCitation | The 10th International Conference on Advanced Materials and Devices | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39211 | - |
| dc.language | 영어 | - |
| dc.publisher | ICAMD 2017 | - |
| dc.title | In-situ TEM experimetns for exfoliated graphene sheets | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2017-12-05 | - |
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.