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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | JA | - |
| dc.citation.title | 12th KIM/JIM Joint Symposium (invited talk) | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-20T03:09:34Z | - |
| dc.date.available | 2023-12-20T03:09:34Z | - |
| dc.date.created | 2013-07-17 | - |
| dc.date.issued | 2011 | - |
| dc.identifier.bibliographicCitation | 12th KIM/JIM Joint Symposium (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39206 | - |
| dc.language | 영어 | - |
| dc.publisher | Japan Institute of Metals | - |
| dc.title | TEM Investigation on Grain Boundaries in Monolayer Graphene | - |
| dc.type | Conference Paper | - |
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