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- Lee, Zonghoon
- Atomic-Scale Electron Microscopy Lab.
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| DC Field | Value | Language |
|---|---|---|
| dc.citation.conferencePlace | KO | - |
| dc.citation.title | FEI User Meeting (invited talk) | - |
| dc.contributor.author | Lee, Zonghoon | - |
| dc.date.accessioned | 2023-12-20T01:10:25Z | - |
| dc.date.available | 2023-12-20T01:10:25Z | - |
| dc.date.created | 2014-05-15 | - |
| dc.date.issued | 2013 | - |
| dc.identifier.bibliographicCitation | FEI User Meeting (invited talk) | - |
| dc.identifier.uri | https://scholarworks.unist.ac.kr/handle/201301/39199 | - |
| dc.language | 한국어 | - |
| dc.publisher | 한국현미경학회, FEI | - |
| dc.title | Atomic-scale Graphene Research using Low kV Aberration-corrected FEI Titan Cube | - |
| dc.type | Conference Paper | - |
| dc.date.conferenceDate | 2013 | - |
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