dc.citation.conferencePlace |
US |
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dc.citation.title |
2017 MRS Spring Meeting & Exhibit |
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dc.contributor.author |
Choi, Jae Hong |
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dc.contributor.author |
Lee,Chang Young |
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dc.date.accessioned |
2023-12-19T19:09:23Z |
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dc.date.available |
2023-12-19T19:09:23Z |
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dc.date.created |
2018-01-09 |
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dc.date.issued |
2017-04-19 |
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dc.description.abstract |
Scanning electron microscopy (SEM) is a principal tool for studying nanomaterials, including carbon nanotubes and graphene. Imaging carbon nanomaterials by SEM, however, increases the disorder mode (D-mode) in their Raman spectra. Early studies, which relied on ambiguous ensemble measurements, claimed that the D-mode indicates damage to the specimens by the low-energy electron beam (e-beam). This claim has been accepted by the nanomaterials community for more than a decade without thorough examination. Here we demonstrate that a low-energy e-beam does not damage carbon nanomaterials. By performing measurements on single nanotubes, we independently examined the following factors: 1) the e-beam irradiation itself, 2) the e-beam-deposited hydrocarbon, and 3) the amorphous carbon deposited during synthesis of the material. We concluded that the e-beam-induced D-mode of both carbon nanotubes and graphene originates solely from the irradiated amorphous carbon and not from the e-beam itself or the hydrocarbon. The results of this study should help minimize potential ambiguities for researchers imaging a broad range of nanomaterials by electron microscopy. |
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dc.identifier.bibliographicCitation |
2017 MRS Spring Meeting & Exhibit |
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dc.identifier.uri |
https://scholarworks.unist.ac.kr/handle/201301/38503 |
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dc.language |
영어 |
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dc.publisher |
Materials Research Society |
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dc.title |
The Low-Energy Electron Beam Does Not Damage Carbon Nanomaterials |
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dc.type |
Conference Paper |
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dc.date.conferenceDate |
2017-04-17 |
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