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Bien, Franklin
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dc.citation.conferencePlace KO -
dc.citation.conferencePlace Jeju -
dc.citation.endPage 101 -
dc.citation.startPage 100 -
dc.citation.title 11th International SoC Design Conference -
dc.contributor.author Yoo, Yena -
dc.contributor.author Na, Kyungmin -
dc.contributor.author Jang, Heedon -
dc.contributor.author Bien, Franklin -
dc.date.accessioned 2023-12-19T23:08:44Z -
dc.date.available 2023-12-19T23:08:44Z -
dc.date.created 2015-10-28 -
dc.date.issued 2014-11-03 -
dc.description.abstract In this paper, a sensitive and simple structure to measure low mutual capacitance of fingerprint sensor in 130-nm CMOS technology is presented. The proposed fingerprint sensor is integrated with display screen. Present sensing structures use projective capacitive touch technique. However, the new structure applies charging and extracting process (CEP). As using the CEP, the circuit challenges another different fingerprint sensor combined with display screen. Also, the current difference between ridge and valley is about 25 nA. -
dc.identifier.bibliographicCitation 11th International SoC Design Conference, pp.100 - 101 -
dc.identifier.doi 10.1109/ISOCC.2014.7087550 -
dc.identifier.isbn 978-147995126-0 -
dc.identifier.scopusid 2-s2.0-84929402622 -
dc.identifier.uri https://scholarworks.unist.ac.kr/handle/201301/37540 -
dc.identifier.url http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7087550&filter%3DAND(p_IS_Number%3A7087542) -
dc.language 영어 -
dc.publisher IEEE Circuits and Systems Society -
dc.title Low capacitance sensing circuit for fingerprint sensor integrated into display screen based on charging and extracting process -
dc.type Conference Paper -
dc.date.conferenceDate 2014-11-03 -

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